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Talib, Zainal Abidin and Mat Yunus, Wan Mahmood and Mohd Yunos, Mohd Amirul Syafiq and Meor Sulaiman, Meor Yusoff and Paulus, Wilfred Sylvester (2010) X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature. Journal of Materials Science and Engineering, 4 (12 (Serial No. 37)). pp. 28-33. ISSN 1934-8959

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