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Talib, Zainal Abidin and Mat Yunus, Wan Mahmood and Mohd Yunos, Mohd Amirul Syafiq and Meor Sulaiman, Meor Yusoff and Paulus, Wilfred Sylvester
(2010)
X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature.
Journal of Materials Science and Engineering, 4 (12 (Serial No. 37)).
pp. 28-33.
ISSN 1934-8959