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Knife edges technique for focused beam profiling of the photothermal imaging system


Citation

Amran, Azura and Saat, Nor Kamilah (2018) Knife edges technique for focused beam profiling of the photothermal imaging system. In: International Laser Technology and Optics Symposium (ILATOS 2017), 26-28 Sept. 2017, Johor Bahru, Malaysia. (pp. 1-5).

Abstract

In this paper, we demonstrate knife edge techniques for measuring the focused beam profile of the photothermal imaging system. This quick and simple method of profiling the focused beam from Helium-Neon (He-Ne) laser is presented and detected by the PVDF thin film as a sensor. The study of focused beam profile is crucial so as to provide information of the focused beam such as beam resolution, depth of focus and the level of astigmatism of the beam. In knife edge technique, the blade moves across the beam in x and y-direction at varying axial position


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Additional Metadata

Item Type: Conference or Workshop Item (Paper)
Divisions: Faculty of Science
DOI Number: https://doi.org/10.1088/1742-6596/1027/1/012001
Publisher: Institute of Physics Publishing
Keywords: Knife edges technique; Beam profiling; Photothermal imaging system
Depositing User: Mr. Sazali Mohamad
Date Deposited: 05 Dec 2019 09:12
Last Modified: 05 Dec 2019 09:12
Altmetrics: http://www.altmetric.com/details.php?domain=psasir.upm.edu.my&doi=10.1088/1742-6596/1027/1/012001
URI: http://psasir.upm.edu.my/id/eprint/74791
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