UPM Institutional Repository

High-performance nanoporous silicon-based photodetectors


Citation

Thahe, Asaad Aldulimi and Bakhtiar, Hazri and Bidin, Noriah and Hassan, Zainuriah and Qaeed, Motahher A. and Ramizy, Asmiet and Talib, Zainal Abidin and Ahmed, Naser Mahmoud and Omar, Khalid and Al-qaraghuli, Hasan and Husham, Mohammed and Allam, Nageh K. (2018) High-performance nanoporous silicon-based photodetectors. Optik, 168 (2018). 424 - 431. ISSN 0030-4026; ESSN: 1618-1336

Abstract

A series of porous silicon (PSi) samples was prepared using photoelectrochemical etching (PECE) method with optimum current density of 45 mA/cm2. The as-prepared PSi samples were characterized to determine the influence of the etching time (15, 25 and 30 min) on their morphology and electrical properties. The percentage of porosity was estimated via gravimetric analysis. The band gap of the fabricated PSi was ≈2.22 eV. Upon their use to fabricate metal-semiconductor-metal (MSM) ultraviolet photodetectors (UVPD), the fabricated PSi revealed excellent stability and reliability under repetitive shots at 530 nm. Furthermore, very fast rise time (≈0.28 s) was obtained at a bias of 1 V under visible light (530 nm) illumination.


Download File

[img]
Preview
Text
High-performance nanoporous silicon-based photodetectors.pdf

Download (150kB) | Preview

Additional Metadata

Item Type: Article
Divisions: Faculty of Science
Institute of Advanced Technology
DOI Number: https://doi.org/10.1016/j.ijleo.2018.04.084
Publisher: Elsevier
Keywords: Porous silicon; Etching time; Electrical properties; Photodetector
Depositing User: Mr. Sazali Mohamad
Date Deposited: 05 Dec 2019 04:16
Last Modified: 05 Dec 2019 04:16
Altmetrics: http://www.altmetric.com/details.php?domain=psasir.upm.edu.my&doi=/10.1016/j.ijleo.2018.04.084
URI: http://psasir.upm.edu.my/id/eprint/74510
Statistic Details: View Download Statistic

Actions (login required)

View Item View Item