UPM Institutional Repository

Optical complexity in external cavity semiconductor laser


Citation

Rondoni, Lamberto and Kamel Ariffin, Muhammad Rezal and Varatharajoo, Renuganth and Mukherjee, Sayan and Palit, Sanjay Kumar and Banerjee, Santo (2017) Optical complexity in external cavity semiconductor laser. Optics Communications, 387. 257 - 266. ISSN 0030-4018

Abstract

In this article, the window based complexity and output modulation of a time delayed chaotic semiconductor laser (SL) model has been investigated. The window based optical complexity (OC), is measured by introducing the recurrence sample entropy (SampEn). The analysis has been done without and in the presence of external noise. The significant changes in the dynamics can be observed under induced noise with weak strength. It has also been found that there is a strong positive correlation between the output power and the complexity of the system with various sets of parameters. The laser intensity, as well as the OC can be increased with the incremental noise strength and the associated system parameters. Thus, optical complexity quantifies the system dynamics and its instabilities, since is strongly correlated with the laser outputs. This analysis can be applied to measure the laser instabilities and modulation of output power.


Download File

[img] Text (Abstract)
LASER.pdf
Download (5kB)

Additional Metadata

Item Type: Article
Divisions: Institute for Mathematical Research
DOI Number: https://doi.org/10.1016/j.optcom.2016.11.011
Publisher: Elsevier
Keywords: Semiconductor laser; Output power; Chaotic dynamics; Recurrence based entropy; Time-delayed system; Cross-correlation
Depositing User: Ms. Nuraida Ibrahim
Date Deposited: 03 Dec 2020 20:10
Last Modified: 03 Dec 2020 20:10
Altmetrics: http://www.altmetric.com/details.php?domain=psasir.upm.edu.my&doi=10.1016/j.optcom.2016.11.011
URI: http://psasir.upm.edu.my/id/eprint/62598
Statistic Details: View Download Statistic

Actions (login required)

View Item View Item