Citation
You, Kok Yeow and Abbas, Zulkifly and Lee, Chia Yew and Abd Malek, Mohd Fareq and Lee, Kim Yee and Cheng, Ee Meng
(2014)
Modeling and measuring dielectric constants for very thin materials using a coaxial probe.
Radioengineering, 23 (4).
pp. 1016-1025.
ISSN 1210-2512; ESSN: 1805-9600
Abstract
This paper is focused on the non-destructive measurement of the dielectric constants (relative permittivities) of thin dielectric material (0.1-0.5 mm) using an open-ended coaxial probe with an outer diameter of 4.1 mm. Normalized de-embedding and network error calibration procedures were applied to the coaxial probe. The measured reflection coefficients for the thin samples were taken with a vector network analyzer up to 7 GHz, and the calibrated reflection coefficients were converted to relative dielectric constants using an empirical reflection coefficient model. The empirical model was created using the regression method and expressed as a polynomial model, and the coefficients of the model were obtained by fitting the data using the Finite Element Method (FEM).
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Additional Metadata
| Item Type: |
Article
|
| Divisions: |
Faculty of Science |
| Publisher: |
Radioengineering Society |
| Keywords: |
Relative effective permittivity; One-port calibration; Measured reflection coefficient; Open-ended coaxial probe; Thin dielectric substrate |
| Depositing User: |
Nurul Ainie Mokhtar
|
| Date Deposited: |
19 Sep 2016 03:50 |
| Last Modified: |
19 Sep 2016 03:50 |
| URI: |
http://psasir.upm.edu.my/id/eprint/34543 |
| Statistic Details: |
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