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X-ray photoelectron spectroscopy and atomic force microscopy studies on crosslinked chitosan thin film


Citation

Yap, Wing Fen and Mat Yunus, Wan Mahmood and Talib, Zainal Abidin and Yusof, Nor Azah (2011) X-ray photoelectron spectroscopy and atomic force microscopy studies on crosslinked chitosan thin film. International Journal of the Physical Sciences, 6 (11). pp. 2744-2749. ISSN 1992-1950

Abstract

Crosslinked chitosan solution was synthesized by homogeneous reaction of medium molecular weight chitosan in aqueous acetic acid solution with glutaraldehyde as crosslinking agent. The solution was then deposited on glass cover slip by spin coating to form thin film. The crosslinked chitosan thin film had been studied by X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). The XPS data was obtained to evaluate the state of crosslinked chitosan in thin film. The AFM data shows a relatively smooth morphological characteristic.


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Additional Metadata

Item Type: Article
Divisions: Faculty of Science
DOI Number: https://doi.org/10.5897/IJPS11.121
Publisher: Academic Journals
Keywords: Crosslinked chitosan; X-ray photoelectron spectroscopy; Atomic force microscopy
Depositing User: Nur Farahin Ramli
Date Deposited: 15 Jul 2013 01:56
Last Modified: 02 Aug 2017 02:00
Altmetrics: http://www.altmetric.com/details.php?domain=psasir.upm.edu.my&doi=10.5897/IJPS11.121
URI: http://psasir.upm.edu.my/id/eprint/25226
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