Citation
Shahrokh Abadi, Mohammad Hadi and Hamidon, Mohd. Nizar and Shaari, Abdul Halim and Abdullah, Norhafizah and Misron, Norhisam and Wagiran, Rahman
(2010)
Characterization of mixed xWO3(1-x)Y2O3 nanoparticle thick film for gas sensing application.
Sensors, 10 (5).
pp. 5074-5089.
ISSN 1424-8220
Abstract
Microstructural, topology, inner morphology, and gas-sensitivity of mixed xWO(3)(1-x)Y(2)O(3) nanoparticles (x = 1, 0.95, 0.9, 0.85, 0.8) thick-film semiconductor gas sensors were studied. The surface topography and inner morphological properties of the mixed powder and sensing film were characterized with X-ray diffraction (XRD), atomic force microscopy (AFM), transmission electron microscopy (TEM), and scanning electron microscopy (SEM). Also, gas sensitivity properties of the printed films were evaluated in the presence of methane (CH(4)) and butane (C(4)H(10)) at up to 500 °C operating temperature of the sensor. The results show that the doping agent can modify some structural properties and gas sensitivity of the mixed powder.
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Official URL or Download Paper: http://www.mdpi.com/1424-8220/10/5/5074
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Additional Metadata
Item Type: | Article |
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Divisions: | Faculty of Engineering Faculty of Science |
DOI Number: | https://doi.org/10.3390/s100505074 |
Publisher: | Multidisciplinary Digital Publishing Institute |
Keywords: | Gas sensor; Thick film; Nano powder; Tungsten trioxide; Yttrium oxide |
Depositing User: | Nurul Ainie Mokhtar |
Date Deposited: | 08 Jun 2015 07:50 |
Last Modified: | 08 Jun 2015 07:50 |
Altmetrics: | http://www.altmetric.com/details.php?domain=psasir.upm.edu.my&doi=10.3390/s100505074 |
URI: | http://psasir.upm.edu.my/id/eprint/13544 |
Statistic Details: | View Download Statistic |
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