UPM Institutional Repository

Characterization of mixed xWO3(1-x)Y2O3 nanoparticle thick film for gas sensing application


Citation

Shahrokh Abadi, Mohammad Hadi and Hamidon, Mohd. Nizar and Shaari, Abdul Halim and Abdullah, Norhafizah and Misron, Norhisam and Wagiran, Rahman (2010) Characterization of mixed xWO3(1-x)Y2O3 nanoparticle thick film for gas sensing application. Sensors, 10 (5). pp. 5074-5089. ISSN 1424-8220

Abstract

Microstructural, topology, inner morphology, and gas-sensitivity of mixed xWO(3)(1-x)Y(2)O(3) nanoparticles (x = 1, 0.95, 0.9, 0.85, 0.8) thick-film semiconductor gas sensors were studied. The surface topography and inner morphological properties of the mixed powder and sensing film were characterized with X-ray diffraction (XRD), atomic force microscopy (AFM), transmission electron microscopy (TEM), and scanning electron microscopy (SEM). Also, gas sensitivity properties of the printed films were evaluated in the presence of methane (CH(4)) and butane (C(4)H(10)) at up to 500 °C operating temperature of the sensor. The results show that the doping agent can modify some structural properties and gas sensitivity of the mixed powder.


Download File

Full text not available from this repository.
Official URL or Download Paper: http://www.mdpi.com/1424-8220/10/5/5074

Additional Metadata

Item Type: Article
Divisions: Faculty of Engineering
Faculty of Science
DOI Number: https://doi.org/10.3390/s100505074
Publisher: Multidisciplinary Digital Publishing Institute
Keywords: Gas sensor; Thick film; Nano powder; Tungsten trioxide; Yttrium oxide
Depositing User: Nurul Ainie Mokhtar
Date Deposited: 08 Jun 2015 07:50
Last Modified: 08 Jun 2015 07:50
Altmetrics: http://www.altmetric.com/details.php?domain=psasir.upm.edu.my&doi=10.3390/s100505074
URI: http://psasir.upm.edu.my/id/eprint/13544
Statistic Details: View Download Statistic

Actions (login required)

View Item View Item