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A carbon conductive filament-induced robust resistance switching behavior for brain-inspired computing


Citation

Yu, Tianqi and Wang, Dong and Liu, Min and Lei, Wei and Shafie, Suhaidi and Mohtar, Mohd Nazim and Jindapetch, Nattha and van Paphavee, Dommelen and Zhao, Zhiwei (2024) A carbon conductive filament-induced robust resistance switching behavior for brain-inspired computing. Materials Horizons, 11 (5). pp. 1334-1343. ISSN 2051-6347; eISSN: 2051-6355

Abstract

Memristors have revolutionized the path forward for brain-inspired computing. However, the instability of the nucleation process of conductive filaments based on active metal electrodes leads to the discrete distribution of switching parameters, which hinders the realization of high-performance and low-power devices for neuromorphic computing. In response, a carbon conductive filament-induced robust memristor is demonstrated with variation coefficients as low as 3.9%/−1.18%, a threshold power as low as 10−9 W, and 3 × 106 s retention and 107 cycle endurance behaviors can be maintained. The recognition accuracy for Modified National Institute of Standards and Technology (MNIST) handwriting is as high as 96.87%, attributed to the high linearity of the iterative updating of synaptic weights. The demodulation and storage functions of the American Standard Code for Information Interchange (ASCII) are demonstrated by programmable pulse modulation. Notably, the transmission electron microscopy (TEM) images allow the observation of carbon conductive filament paths formed in the low resistance state. First-principles calculations analyze the energetics of defects involved in the diffusion of carbon atoms into MoTe2 films. This work presents a novel guideline for studying memristor-based neuromorphic computing.


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Additional Metadata

Item Type: Article
Divisions: Institut Nanosains dan Nanoteknologi
DOI Number: https://doi.org/10.1039/d3mh01762a
Publisher: Royal Society of Chemistry
Keywords: Memristors; Brain-inspired computing; Neuromorphic computing; Carbon conductive filament; Robust resistance switching
Depositing User: Ms. Zaimah Saiful Yazan
Date Deposited: 23 Apr 2025 02:07
Last Modified: 23 Apr 2025 02:07
Altmetrics: http://www.altmetric.com/details.php?domain=psasir.upm.edu.my&doi=10.1039/d3mh01762a
URI: http://psasir.upm.edu.my/id/eprint/117022
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