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A 0.4 V, 12.2 pW leakage, 36.5 fJ/step switching efficiency data retention flip-flop in 22 nm FDSOI


Citation

Ji, Yuxin and Zhang, Yuhang and Chen, Changyan and Zhao, Jian and Rokhani, Fakhrul Zaman and Ismail, Yehea and Li, Yongfu (2024) A 0.4 V, 12.2 pW leakage, 36.5 fJ/step switching efficiency data retention flip-flop in 22 nm FDSOI. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. pp. 1-5. ISSN 1063-8210; eISSN: 1557-9999

Abstract

Data-retention flip-flops (DR-FFs) efficiently maintain data during sleep mode, and retain state during transitions between active and sleep mode. This brief proposes an ultralow power DR-FF design with an improved autonomous data-retention (ADR) latch operating with a supply voltage range down to near/subthreshold, achieving a sleep mode leakage power of 12.2 pW, 1.4 × -3.8 × less than the prior CMOS DR-FFs. Our proposed DR-FFs consume the lowest active mode switching efficiency of 36.5 fJ/step, 1.2 × -4 × less than the prior works, and a comparable transition efficiency of 1.9 fJ/step. Furthermore, our proposed DR-FFs require minimal control signals, logic gates, and switches, significantly reducing design complexity, and avoiding the drawbacks of nonvolatile data retention FFs (NV-FFs).


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Official URL or Download Paper: https://ieeexplore.ieee.org/document/10684787/

Additional Metadata

Item Type: Article
Divisions: Faculty of Engineering
DOI Number: https://doi.org/10.1109/TVLSI.2024.3453946
Publisher: Institute of Electrical and Electronics Engineers
Keywords: Data/state retention; Flip-flop; Ultralow power
Depositing User: Ms. Nur Faseha Mohd Kadim
Date Deposited: 08 Jan 2025 06:21
Last Modified: 08 Jan 2025 06:21
Altmetrics: http://www.altmetric.com/details.php?domain=psasir.upm.edu.my&doi=10.1109/TVLSI.2024.3453946
URI: http://psasir.upm.edu.my/id/eprint/114238
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