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A promising exponentially-fitted two-derivative Runge–Kutta–Nyström method for solving y′′=f(x,y): Application to Verhulst logistic growth model


Citation

Lee, K.C. and Nazar, R. and Senu, N. and Ahmadian, A. (2024) A promising exponentially-fitted two-derivative Runge–Kutta–Nyström method for solving y′′=f(x,y): Application to Verhulst logistic growth model. Mathematics and Computers in Simulation, 219. pp. 28-49. ISSN 0378-4754

Abstract

Explicit exponentially-fitted two-derivative Runge–Kutta–Nyström method with single -function and multiple third derivatives is proposed for solving special type of second-order ordinary differential equations with exponential solutions. B-series and rooted tree theory for the proposed method are developed for the derivation of order conditions. Then, we build frequency-dependent coefficients for the proposed method by integrating the second-order initial value problem exactly with solution in the linear composition of set functions and with . An exponentially-fitted two-derivative Runge–Kutta–Nyström method with three stages fifth order is derived. Linear stability and stability region of the proposed method are analyzed. The numerical tests show that the proposed method is more effective than other existing methods with similar algebraic order in the integration of special type of second-order ordinary differential equations with exponential solutions. Also, the proposed method is used to solve a famous application problem, Verhulst logistic growth model and the result shows the proposed method still works effectively for solving this model.


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Additional Metadata

Item Type: Article
Divisions: Institute for Mathematical Research
DOI Number: https://doi.org/10.1016/j.matcom.2023.12.018
Publisher: Elsevier
Keywords: Two-derivative Runge–Kutta–Nyström method; Second-order ordinary differential equations; Exponentially-fitted; Stability region; Numerical test
Depositing User: Ms. Azian Edawati Zakaria
Date Deposited: 23 Oct 2024 03:05
Last Modified: 23 Oct 2024 03:05
Altmetrics: http://www.altmetric.com/details.php?domain=psasir.upm.edu.my&doi=10.1016/j.matcom.2023.12.018
URI: http://psasir.upm.edu.my/id/eprint/112124
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