Citation
Junaidu, Mustapha Hassan and Liew, Josephine Ying Chyi and Onimisi, Muhammad Y. and Tafida, Rabiu Abubakar and Bello, Musa and Adezuka, Yahaya and Owolabi, Joshua Adeyemi and Lawal, H.A.
(2024)
Characteristics of hydrothermally synthesized SnS2 for thin film use.
Journal of Materials Science: Materials in Electronics, 35 (6).
art. no. 380.
pp. 1-9.
ISSN 0957-4522; ESSN: 1573-482X
Abstract
Tin disulfide (SnS2) nanoparticles were synthesized via hydrothermal process and were deposited as ultrathin layer (27.5 nm) onto SLG via vacuum thermal evaporation. The SnS2 nanoparticles were characterized for their structural, purity, chemical, morphological, optical and electrical properties. The XRD patterns and the Raman spectra confirmed the successful synthesis of SnS2 nanoparticles. The stoichiometry and leaf like structure obtained from EDS and FESEM analysis of the SnS2 nanoparticles further proved its formation. The ultrathin layer deposited and annealed at 300 °C for 1 h showed XRD patterns of hexagonal structured SnS2 with crystallinity of 57.7 nm, bandgap energy of 2.7 eV and resistivity of 0.65 Ω cm.
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Additional Metadata
| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Science Institut Nanosains dan Nanoteknologi |
| DOI Number: | https://doi.org/10.1007/s10854-024-12178-3 |
| Publisher: | Springer Nature |
| Keywords: | Crystallinity; IV-VI semiconductors; Nanoparticles; Synthesis (chemical); Thermal evaporation; Tin compounds; Vacuum evaporation; X ray diffraction; Cristallinity; Film use; Hydrothermal process; Hydrothermally synthesized; Optical and electrical properties; Synthesised; Thin-films; Ultrathin layers; Vacuum thermal evaporation; XRD patterns; Sulfur compounds |
| Depositing User: | Mr. Mohamad Syahrul Nizam Md Ishak |
| Date Deposited: | 16 Jun 2024 03:21 |
| Last Modified: | 16 Jun 2024 03:21 |
| Altmetrics: | http://www.altmetric.com/details.php?domain=psasir.upm.edu.my&doi=10.1007%2Fs10854-024-12178-3 |
| URI: | http://psasir.upm.edu.my/id/eprint/106326 |
| Statistic Details: | View Download Statistic |
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