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Number of items: 2.
K
Kooh, Roy Jinn Chye
(2000)
Device Characterization of 0.8-µm CMOS Technology.
Masters thesis, Universiti Putra Malaysia.
Z
Zakaria, Nor Azura
(2013)
Multiple and solid data background scheme for testing static single cell faults on SRAM memories.
Masters thesis, Universiti Putra Malaysia.