Browse by Journal Title
 | Up a level |
Number of items: 1.
Chlaab, Asaad Kadhum and Flayyih, Wameedh Nazar and Rokhani, Fakhrul Zaman
(2020)
Reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect.
Journal of Engineering, 26 (6).
94 - 106.
ISSN 1726-4073; ESSN: 250-3339