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Ji, Yuxin and Zhang, Yuhang and Chen, Changyan and Zhao, Jian and Rokhani, Fakhrul Zaman and Ismail, Yehea and Li, Yongfu (2024) A 0.4 V, 12.2 pW leakage, 36.5 fJ/step switching efficiency data retention flip-flop in 22 nm FDSOI. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. pp. 1-5. ISSN 1063-8210; eISSN: 1557-9999

Rahimipour, Somayeh and Flayyih, Wameedh Nazar and Kamsani, Noor Ain and Hashim, Shaiful Jahari and Stan, Mircea R. and Rokhani, Fakhrul Zaman (2020) Low-power, highly reliable dynamic thermal management by exploiting approximate computing. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 28 (10). 2210 - 2222. ISSN 1063-8210; ESSN: 1557-9999