UPM Institutional Repository

Items where Author is "Hutagalung, Sabar D."

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Number of items: 6.

Article

Dehzangi, Arash and Larki, Farhad and Majlis, Burhanuddin Yeop and Naseri, Mahmood Goodarz and Navasery, Manizheh and Abdullah, A. Makarimi and Hutagalung, Sabar D. and Abdul Hamid, Norihan and Mohd Noor, Mimiwaty and Vakilian, Mohammadmahdi and Saion, Elias (2013) Impact of KOH etching on nanostructure fabricated by local anodic oxidation method. International Journal of Electrochemical Science, 8 (6). pp. 8084-8096. ISSN 1452-3981

Larki, Farhad and Dehzangi, Arash and Hassan, Jumiah and Abedini, Alam and Saion, Elias and Hutagalung, Sabar D. and Abdullah, A. Makarimi and Hamidon, Mohd. Nizar (2013) Pinch-off effect in p-type double gate and single gate junctionless silicon nanowire transistor fabricated by atomic force microscopy nanolithography. Nano Hybrids, 4. pp. 33-45. ISSN 2235-8129; ESSN: 2234-9871

Larki, Farhad and Dehzangi, Arash and Saion, Elias and Abedini, Alam and Hutagalung, Sabar D. and Abdullah, A. Makarimi (2013) Simulation of transport in laterally gated junctionless transistors fabricated by local anodization with an atomic force microscope. Physica Status Solidi (A) Applications and Materials Science, 210 (9). pp. 1914-1919. ISSN 1862-6300; ESSN: 1862-6319

Conference or Workshop Item

Dehzangi, Arash and Larki, Farhad and Yeop Majlis, Burhanuddin and Kazemi, Zainab and Ariannejad, Mohammadmahdi and Abdullah, Ahmad Makarimi and Naseri, Mahmoud Goodarz and Navasery, Manizheh and Saion, Elias and Mohamed Kamari, Halimah and Khalilzadeh, Nasrin and Hutagalung, Sabar D. (2014) Atomic force microscope base nanolithography for reproducible micro and nanofabrication. In: 2014 IEEE International Conference on Semiconductor Electronics (ICSE), 27-29 Aug. 2014, Berjaya Times Square, Kuala Lumpur, Malaysia. (pp. 408-411).

Larki, Farhad and Dehzangi, Arash and Md. Ali, Sawal Hamid and Jalar @ Jalil, Azman and Islam, Md. Shabiul and Yeop Majlis, Burhanuddin and Saion, Elias and Hamidon, Mohd Nizar and Hutagalung, Sabar D. (2014) Dependency of electrical characteristics on nano gap variation in pinch off lateral gate transistors. In: 2014 IEEE International Conference on Semiconductor Electronics (ICSE 2014), 27-29 Aug. 2014, Berjaya Times Square Hotel, Kuala Lumpur, Malaysia. (pp. 170-173).

Dehzangi, Arash and Larki, Farhad and Saion, Elias and Hutagalung, Sabar D. and Hamidon, Mohd Nizar and Hassan, Jumiah (2011) Field effect in silicon nanostructure fabricated by atomic force microscopy nano lithography. In: 2011 IEEE Regional Symposium on Micro and Nanoelectronics (RSM 2011), 28-30 Sept. 2011, Le Meridien Hotel, Kota Kinabalu, Sabah. (pp. 104-107).

This list was generated on Fri Mar 29 03:51:10 2024 +08.