Items where Author is "Chen, Changyan"
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Ji, Yuxin and Zhang, Yuhang and Chen, Changyan and Zhao, Jian and Rokhani, Fakhrul Zaman and Ismail, Yehea and Li, Yongfu
(2024)
A 0.4 V, 12.2 pW leakage, 36.5 fJ/step switching efficiency data retention flip-flop in 22 nm FDSOI.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
pp. 1-5.
ISSN 1063-8210; eISSN: 1557-9999