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Fault detection with optimum March Test Algorithm


Citation

Zakaria, Nor Azura and Wan Hasan, Wan Zuha and Abdul Halin, Izhal and Mohd Sidek, Roslina and Wen, Xiaoqing (2012) Fault detection with optimum March Test Algorithm. In: 3rd International Conference on Intelligent System Modelling and Simulation, 8-10 Feb. 2012, Sabah, Malaysia. (pp. 700-704).

Abstract

Integrating a large number of embedded memories in System-on-Chips (SoC’s) occupies up to more than 70% of the die size, thus requiring Built-In Self-Test (BIST) with the smallest possible area overhead. This paper analyzes MATS++(6N), March C-(10N), March SR(14N), and March CL(12N) test algorithms and shows that they cannot detect either Write Disturb Faults (WDFs) or Deceptive Read Destructive Faults (DRDFs) or both. Therefore to improve fault detection, an automation program is developed based on sequence operation (SQ) generation rules. However after solving the undetected fault, the outcome in term of its detection result of Static Double Cell Faults using the specified test algorithm especially Transition Coupling Faults (CFtrs), Write Destructive Coupling Faults (CFwds), Read Destructive Coupling Faults (CFrds) and Deceptive Read Destructive Faults (CFdrds) are observed.


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Additional Metadata

Item Type: Conference or Workshop Item (Paper)
Divisions: Faculty of Engineering
DOI Number: https://doi.org/10.1109/ISMS.2012.88
Publisher: IEEE
Keywords: Deceptive Read Destructive Faults; Write Disturb Faults; March Test Algorithm
Depositing User: Azian Edawati Zakaria
Date Deposited: 04 Sep 2015 07:33
Last Modified: 04 Sep 2015 07:33
Altmetrics: http://www.altmetric.com/details.php?domain=psasir.upm.edu.my&doi=10.1109/ISMS.2012.88
URI: http://psasir.upm.edu.my/id/eprint/40179
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