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Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate


Citation

Navaseri, M. and Shaari, Abdul Halim and Lim, Kean Pah and Chen, Soo Kien and Abd Shukor, Roslan (2014) Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate. Solid State Science and Technology, 22 (1&2). pp. 66-72. ISSN 0128-7389

Abstract

By pulsed laser ablation magnetoresistive perovskite-like La5/8Ca3/8MnO3 films have been successfully grown on silicon wafer substrates without any buffer layer. The X-ray diffraction (XRD) patterns of the LCMO/Si heterostructure indicate that well crystalline LCMO grows polycrystalline with average grain size of 15nm. The LCMO films exhibited typical characteristics of CMR material with the metal-insulator transition temperature at TP=245 K. The film has a maximum %MR of about %16.52 and mean surface roughness of about 147.4 nm.


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Additional Metadata

Item Type: Article
Divisions: Faculty of Science
Publisher: Malaysian Solid State Science and Technology Society
Keywords: Magnetoresistance; Manganite; Grain boundary; Metal–insulator transition temperature
Depositing User: Nabilah Mustapa
Date Deposited: 15 Sep 2015 14:45
Last Modified: 04 Dec 2015 02:14
URI: http://psasir.upm.edu.my/id/eprint/37802
Statistic Details: View Download Statistic

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