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12N test procedure for NPSF testing and diagnosis for SRAMs


Rusli, Julie Roslita and Wan Hasan, Wan Zuha and Mohd Sidek, Roslina (2008) 12N test procedure for NPSF testing and diagnosis for SRAMs. In: 2008 IEEE International Conference on Semiconductor Electronics (ICSE 2008), 25-27 Nov. 2008, Johor Bahru, Malaysia. (pp. 430-435).


Testing and diagnosis techniques play a key role in the advance of semiconductor memory technologies. The challenge of failure detection has attracted investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. March algorithms are widely used in SRAM testing to detect and diagnose SRAM fault model since they are relatively simple and yet providing high fault coverage and diagnostic resolution. In this case to achieve high fault coverage the structure of the consecutive memory backgrounds are very important. This paper aims to prove the efficiency of March 12N algorithm in term of detection and identification capability and locate the NPSF model fault. The details of test and diagnosis procedures for NPSF are demonstrated in this paper. The fault detection and diagnostic of the SRAM memories in this paper is verified and proven. The required march elements, detection requirement, detection conditions and fault syndromes are also enlightened. Furthermore, these particulars are required to determine a good algorithm other applications.

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Additional Metadata

Item Type: Conference or Workshop Item (Paper)
Divisions: Faculty of Engineering
DOI Number: https://doi.org/10.1109/SMELEC.2008.4770357
Publisher: IEEE
Keywords: Neighborhood pattern sensitive fault; Test procedure; March algorithm; Multi data background SRAM
Depositing User: Nabilah Mustapa
Date Deposited: 10 Aug 2020 02:24
Last Modified: 10 Aug 2020 02:24
Altmetrics: http://www.altmetric.com/details.php?domain=psasir.upm.edu.my&doi=10.1109/SMELEC.2008.4770357
URI: http://psasir.upm.edu.my/id/eprint/37750
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