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Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans


Citation

Wan Yusof, Wan Mohamad Daud and Talib, Zainal Abidin and Ismail, Mohd Zaid (1999) Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans. Pertanika Journal of Science & Technology, 7 (2). pp. 125-131. ISSN 0128-7680

Abstract / Synopsis

This work describes a method to obtain surface microtopography of a material by scanning its capacitance. Capacitance was measured by the three terminal method with the core of a coaxial cable used as the measuring probe while the shielding wire acted as the guard electrode to eliminate the fringing field effect. From our results, we found that good image resolution is best obtained if the medium used has a high dielectric constant than the sample.


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Additional Metadata

Item Type: Article
Divisions: Faculty of Environmental Studies
Publisher: Universiti Putra Malaysia Press
Keywords: Spektroskopi dielektrik, kaedah tiga terminal, topografi mikro bagi permukaan
Depositing User: Nur Izzati Mohd Zaki
Date Deposited: 26 Nov 2009 15:37
Last Modified: 27 May 2013 15:08
URI: http://psasir.upm.edu.my/id/eprint/3490
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