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Fault simulation using MPMSLFSR-based test pattern


Citation

Ali, Md. Liakot and Mohd. Sidek, Roslina and Mohd. Ali, Alauddin and Suparjoo, Bambang Sunaryo and Wan Hasan, Wan Zuha (2002) Fault simulation using MPMSLFSR-based test pattern. In: 2nd World Engineering Congress, 22 - 25 July 2002, Sarawak, Malaysia. (pp. 285-288).

Abstract / Synopsis

This paper presents fault simulation results of ISCAS85 bench-mark circuits using test pattern employing multiple polynomial, multiple seed linear feedback shift register (MPMSLFSR). It has been shown that proper feedback connection and appropriate seed of LFSR produces better fault coverage using lower number of test pattern. We have also compared and validated the results with that of other researchers.


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Additional Metadata

Item Type: Conference or Workshop Item (Paper)
Divisions: Faculty of Engineering
Publisher: Universiti Putra Malaysia Press
Keywords: MPMSL-FSR-Based test pattern; Fault simulation
Depositing User: Erni Suraya Abdul Aziz
Date Deposited: 13 Mar 2015 09:29
Last Modified: 13 Mar 2015 09:29
URI: http://psasir.upm.edu.my/id/eprint/18384
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