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Structural and electrical conductivity studies of polycrystalline copper selenide at low temperature


Citation

Talib, Zainal Abidin and Liew, Josephine Ying Chyi and Mat Yunus, Wan Mahmood and Zainal, Zulkarnain and Shaari, Abdul Halim and Abd. Moksin, Mohd Maarof and Lim, Kean Pah and Wan Yusoff, Wan Mohamad Daud (2008) Structural and electrical conductivity studies of polycrystalline copper selenide at low temperature. Solid State Science and Technology, 16 (1). pp. 147-152. ISSN 0128-7389

Abstract

This paper reports the structural and electrical conductivity characterization of the copper selenide (CuSe) metal chalcogenide semiconductor in bulk form. In situ X-ray powder diffraction analysis of CuSe at low temperature (100 – 300 K) is studied to support the electrical conductivity analysis. The electrical conductivity of the polycrystalline CuSe was measured and analyzed at low temperature (100 to 286 K)using 4 point probe technique. The electrical conductivity values obtained were in the range of 1.69 x 103 to 2.58 x 103 S/cm.


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Additional Metadata

Item Type: Article
Divisions: Faculty of Science
Publisher: Malaysian Solid State Science and Technology Society
Keywords: Copper selenide; Metal chalcogenide semiconductor; Bulk form
Depositing User: Najwani Amir Sariffudin
Date Deposited: 20 May 2013 09:25
Last Modified: 26 Sep 2016 01:48
URI: http://psasir.upm.edu.my/id/eprint/16865
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