Novel low loss and temperature stabilized (Na1-xLix)0.5(Sm1-xBix)0.5MoO4(x = 0.05−0.2) microwave ceramics for low-temperature cofired ceramic technology

This study focused on achieving low loss and temperature stabilized microwave dielectric ceramics. A novel scheelite structured (Na1-xLix)0.5(Sm1-xBix)0.5MoO4(NLSBMx, where x = 0.05−0.2) ceramics with the excellent microwave dielectric properties at low sintering temperatures. The structural influences on dielectric behavior were systematically explored through X-ray diffraction (XRD), Raman spectroscopy, and microstructure analysis. Results confirmed that the NLSBMx (x = 0.05−0.2) ceramics crystallize in a pure tetragonal scheelite structure. The NLSBMx system exhibited exceptional performance at low sintering temperatures (675−900 °C), with εrvalues of 11.6–14.6, Q × f values of 38,900−17,700 GHz, and τfvalues ranging from −35.5 to +2.7 ppm/°C. Notably, the NLSBM0.15 ceramic sintered at 825 °C demonstrated optimal properties: εr∼13.5, Q × f ∼23,000 GHz (at 9.03 GHz), and τf ∼ −10.4 ppm/°C. Using the Phillips-Vechten-Levine (P-V-L) chemical bond theory, bond ionicity (fi), lattice energy (U), and thermal expansion coefficient (αL) were calculated. The Mo–O bonds exhibited higher fiand U, indicating their dominant role in enhancing dielectric performance. Additionally, the A–O bonds (A = Na/Li/Sm/Bi) were found to positively influence the properties of the NLSBMx system. The chemical compatibility of NLSBMx (x = 0.05−0.2) ceramics with silver electrodes makes it a potential material for applications in low-temperature co-fired ceramic (LTCC) technology for 5G/6G communication systems.

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