Wan Yusof, Wan Mohamad Daud and Talib, Zainal Abidin and Ismail, Mohd Zaid (1999) Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans. Pertanika Journal of Science & Technology, 7 (2). pp. 125-131. ISSN 0128-7680
This work describes a method to obtain surface microtopography of a material by scanning its capacitance. Capacitance was measured by the three terminal method with the core of a coaxial cable used as the measuring probe while the shielding wire acted as the guard electrode to eliminate the fringing field effect. From our results, we found that good image resolution is best obtained if the medium used has a high dielectric constant than the sample.
|Keyword:||Spektroskopi dielektrik, kaedah tiga terminal, topografi mikro bagi permukaan|
|Faculty or Institute:||Faculty of Environmental Studies|
|Publisher:||Universiti Putra Malaysia Press|
|Deposited By:||Nur Izzati Mohd Zaki|
|Deposited On:||26 Nov 2009 07:37|
|Last Modified:||27 May 2013 07:08|
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