Assessment of near infrared LED radiation pattern using Otsu thresholding

Citation

Mohd Noh, Zarina and Ramli, Abdul Rahman and Saripan, M. Iqbal and Hanafi, Marsyita (2015) Assessment of near infrared LED radiation pattern using Otsu thresholding. In: 2015 IEEE Student Symposium in Biomedical Engineering & Sciences (ISSBES 2015), 4 Nov. 2015, UiTM Shah Alam, Selangor. (pp. 1-6).

Abstract

This paper describes the use of Otsu thresholding method in assessing the radiation pattern emitted by near infrared (NIR) LED. The NIR LED configured in this paper is intended to be used as illumination source for the development of a NIR palm vein image acquisition device. The experiment is conducted using a single board computer (SBC) to promote a real-time embedded system development that can be readily integrated as a vein viewing device. Based on the Otsu thresholded image obtained, it is observed that the NIR LED radiation pattern can be accessed subjectively through the thresholding process. The resulted thresholded image can be used as preliminary assessment of the radiation pattern in developing a NIR image acquisition system that fully utilizes the NIR LED properties.

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Additional Metadata

Item Type:	Conference or Workshop Item (Paper)
Divisions:	Faculty of Engineering
DOI Number:	https://doi.org/10.1109/ISSBES.2015.7435897
Publisher:	IEEE
Keywords:	Near infrared illumination source; Near infrared image acquisition device; Near infrared LED radiation pattern; Otsu thresholding; Palm vein image acquisition; Vein viewing device
Depositing User:	Nabilah Mustapa
Date Deposited:	31 Jul 2017 04:13
Last Modified:	31 Jul 2017 04:13
Altmetrics:	http://www.altmetric.com/details.php?domain=psasir.upm.edu.my&doi=10.1109/ISSBES.2015.7435897
URI:	http://psasir.upm.edu.my/id/eprint/56266
Statistic Details:	View Download Statistic

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