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Characterization of semiconductor nanowires using optical tweezers


Citation

Reece, Peter J. and Toe, Wen Jun and Wang, Fan and Paiman, Suriati and Gao, Qiang and Tan, Hark Hoe and Jagadish, Chennupati (2011) Characterization of semiconductor nanowires using optical tweezers. Nano Letters, 11 (6). pp. 2375-2381. ISSN 1530-6984; ESSN: 1530-6992

Abstract

We report on the optical trapping characteristics of InP nanowires with dimensions of 30 (±6) nm in diameter and 2 - 15 μm in length. We describe a method for calibrating the absolute position of individual nanowires relative to the trapping center using synchronous high-speed position sensing and acousto-optic beam switching. Through Brownian dynamics we investigate effects of the laser power and polarization on trap stability, as well as length dependence and the effect of simultaneous trapping multiple nanowires.


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Official URL or Download Paper: http://pubs.acs.org/doi/abs/10.1021/nl200720m

Additional Metadata

Item Type: Article
Divisions: Faculty of Science
DOI Number: https://doi.org/10.1021/nl200720m
Publisher: American Chemical Society
Keywords: Semiconductor nanowires; Optical tweezers; Brownian motion; Nanoparticle metrology
Depositing User: Nur Farahin Ramli
Date Deposited: 28 Aug 2013 02:34
Last Modified: 24 Aug 2016 02:09
Altmetrics: http://www.altmetric.com/details.php?domain=psasir.upm.edu.my&doi=10.1021/nl200720m
URI: http://psasir.upm.edu.my/id/eprint/24834
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